| 摘要 |
The apparatus comprises an inspection location, a camera arrangement, and a double backlight mesh means. Wherein, the inspection location is located between the camera arrangement and the double backlight mesh means; the camera arrangement comprises a camera (1) facing a first side of the inspection location, a lens arrangement (2, 4) and a light source (3); and the double backlight mesh means comprises a first transparent backlight (7) positioned immediately adjacent to a second side of the inspection location, a second backlight (9) positioned adjacent the first backlight (7), and a mesh (8) positioned between the first backlight (7) and the second backlight (9). The method comprises the steps of positioning a contact lens (5) in the inspection location; controlling the light source (3) and the double backlight mesh means to apply different lighting conditions to the contact lens (5) in a predetermined sequence; taking a plurality of images of the contact lens (5) with the camera (1) as the different lighting conditions are applied; and analysing the images to detect and classify and defects in the contact lens (5). The apparatus and method are particularly beneficial as they allow different lighting conditions, including mesh backlighting to be applied to a contact lens, whilst it is in the inspection location solely using electrical control of the components of the apparatus, without any need to move either the contact lens or the mesh. |
