发明名称 ウェハ処理堆積物遮蔽構成材
摘要 Embodiments described herein generally relate to components for a semiconductor processing chamber, a process kit for a semiconductor processing chamber, and a semiconductor processing chamber having a process kit. In one embodiment a lower shield for encircling a sputtering target and a substrate support is provided. The lower shield comprises a cylindrical outer band having a first diameter dimensioned to encircle the sputtering surface of the sputtering target and the substrate support, the cylindrical band comprising a top wall that surrounds a sputtering surface of a sputtering target and a bottom wall that surrounds the substrate support, a support ledge comprising a resting surface and extending radially outward from the cylindrical outer band, a base plate extending radially inward from the bottom wall of the cylindrical band, and a cylindrical inner band coupled with the base plate and partially surrounding a peripheral edge of the substrate support.
申请公布号 JP5916384(B2) 申请公布日期 2016.05.11
申请号 JP20110505129 申请日期 2009.04.14
申请人 アプライド マテリアルズ インコーポレイテッドAPPLIED MATERIALS,INCORPORATED 发明人 リケル マーチン リー;ミラー キース エー;サブラマニ アナンサ ケー
分类号 C23C14/00;C23C14/34 主分类号 C23C14/00
代理机构 代理人
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