| 摘要 |
A system for inspecting an object that is at least translucent extending along a vertical axis A, having at least one marking and being located in an inspection area including at least one inspection assembly that comprises a main illumination device positioned on one side of the inspection area, comprising a light source and emitting at least one light beam of illumination axis Δ. An acquisition device is positioned opposite the illumination device relative to the inspection area and comprising acquisition optics of optical axis Δ′ and an image sensor optically aligned with the acquisition optics. |
