DEFECT-AND-FAILURE-TOLERANT DEMULTIPLEXER USING SERIES REPLICATION AND ERROR-CONTROL ENCODING

摘要

A compound transistor (402) comprising: m branches; and n serially linked simple transistors in each of the m branches (410,412 and 411,413). Two or more serially connected transistors (410,412, and 411,413) are employed in each reversibly switchable interconnection, so that short defects in up to one less than the number of serially interconnected transistors does not lead to failure of the reversibly switchable interconnection.