发明名称 メモリにおける基準ビットラインの使用
摘要 Methods, memories and systems may include charging a sense node to a logic high voltage level, and supplying charge to a bit line and to a reference bit line for a precharge period that is based, at least in part, on a time for a voltage of the reference bit line to reach a reference voltage. A memory cell that is coupled to the bit line may be selected after the precharge period, and a clamp voltage may be set based, at least in part, on the voltage of the reference bit line. If a voltage level of the bit line is less than the clamp voltage level during a sense period, charge may be drained from the sense node, and a state of the memory cell may be determined based, at least in part, on a voltage level of the sense node near an end of the sense period.
申请公布号 JP5914960(B2) 申请公布日期 2016.05.11
申请号 JP20140541439 申请日期 2013.06.18
申请人 インテル・コーポレーション 发明人 ハ、チャン ワン
分类号 G11C16/06 主分类号 G11C16/06
代理机构 代理人
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