发明名称 Reliability measurements for phase based autofocus
摘要 Techniques related to autofocus for imaging devices and, in particular, to generating reliability values associated with phase autofocus shifts are discussed. Such techniques may include performing a curve fitting based on accumulated phase difference values and phase shifts for phase autofocus images and generating a reliability value for a focus phase shift based on the curve fitting.
申请公布号 US9338345(B2) 申请公布日期 2016.05.10
申请号 US201414327798 申请日期 2014.07.10
申请人 Intel Corporation 发明人 Samurov Vitali;Krestyannikov Evgeny;Nikkanen Jarno
分类号 H04N5/232;G03B13/36 主分类号 H04N5/232
代理机构 Green, Howard & Mughal LLP 代理人 Green, Howard & Mughal LLP
主权项 1. A method for providing autofocus for an imaging device comprising: determining, for a region of interest of a scene, a plurality of accumulated phase difference values associated with a plurality of phase shifts for a first phase autofocus image and a second phase autofocus image; performing a curve fitting based on the plurality of accumulated phase difference values and the plurality of phase shifts to generate an accumulated phase difference values fitted curve; generating a reliability value associated with a focus phase shift for the plurality of accumulated phase difference values and the plurality of phase shifts based at least in part on the accumulated phase difference values fitted curve; and focusing the imaging device based at least in part on the reliability value.
地址 Santa Clara CA US