发明名称 |
Reliability measurements for phase based autofocus |
摘要 |
Techniques related to autofocus for imaging devices and, in particular, to generating reliability values associated with phase autofocus shifts are discussed. Such techniques may include performing a curve fitting based on accumulated phase difference values and phase shifts for phase autofocus images and generating a reliability value for a focus phase shift based on the curve fitting. |
申请公布号 |
US9338345(B2) |
申请公布日期 |
2016.05.10 |
申请号 |
US201414327798 |
申请日期 |
2014.07.10 |
申请人 |
Intel Corporation |
发明人 |
Samurov Vitali;Krestyannikov Evgeny;Nikkanen Jarno |
分类号 |
H04N5/232;G03B13/36 |
主分类号 |
H04N5/232 |
代理机构 |
Green, Howard & Mughal LLP |
代理人 |
Green, Howard & Mughal LLP |
主权项 |
1. A method for providing autofocus for an imaging device comprising:
determining, for a region of interest of a scene, a plurality of accumulated phase difference values associated with a plurality of phase shifts for a first phase autofocus image and a second phase autofocus image; performing a curve fitting based on the plurality of accumulated phase difference values and the plurality of phase shifts to generate an accumulated phase difference values fitted curve; generating a reliability value associated with a focus phase shift for the plurality of accumulated phase difference values and the plurality of phase shifts based at least in part on the accumulated phase difference values fitted curve; and focusing the imaging device based at least in part on the reliability value. |
地址 |
Santa Clara CA US |