发明名称 |
Aluminum nitride based semiconductor devices |
摘要 |
Semiconductor structures and techniques are described which enable forming aluminum nitride (AIN) based devices by confining carriers in a region of AIN by exploiting the polar nature of AIN materials. Embodiments of AIN transistors utilizing polarization-based carrier confinement are described. |
申请公布号 |
US9337301(B2) |
申请公布日期 |
2016.05.10 |
申请号 |
US201214367385 |
申请日期 |
2012.12.21 |
申请人 |
Massachusetts Institute of Technology |
发明人 |
Palacios Tomas Apostol;Fujishima Tatsuya |
分类号 |
H01L29/66;H01L29/778;H01L29/201;H01L29/812;H01L29/20;H01L29/205 |
主分类号 |
H01L29/66 |
代理机构 |
Wolf, Greenfield & Sacks, P.C. |
代理人 |
Wolf, Greenfield & Sacks, P.C. |
主权项 |
1. A semiconductor device, comprising:
a first semiconductor region consisting essentially of AlN; and a second semiconductor region having a graded channel, the second semiconductor region having a graded composition, the graded composition being graded from a first side of the second semiconductor region having a first composition consisting essentially of AlN to a second side of the second semiconductor region having a composition of BwAlxInyGazN, wherein w+x+y+z=1, wherein w is greater than or equal to zero, x is greater than or equal to 0.3, y is greater than or equal to zero, and z is greater than or equal to 0. |
地址 |
Cambridge MA US |