发明名称 Aluminum nitride based semiconductor devices
摘要 Semiconductor structures and techniques are described which enable forming aluminum nitride (AIN) based devices by confining carriers in a region of AIN by exploiting the polar nature of AIN materials. Embodiments of AIN transistors utilizing polarization-based carrier confinement are described.
申请公布号 US9337301(B2) 申请公布日期 2016.05.10
申请号 US201214367385 申请日期 2012.12.21
申请人 Massachusetts Institute of Technology 发明人 Palacios Tomas Apostol;Fujishima Tatsuya
分类号 H01L29/66;H01L29/778;H01L29/201;H01L29/812;H01L29/20;H01L29/205 主分类号 H01L29/66
代理机构 Wolf, Greenfield & Sacks, P.C. 代理人 Wolf, Greenfield & Sacks, P.C.
主权项 1. A semiconductor device, comprising: a first semiconductor region consisting essentially of AlN; and a second semiconductor region having a graded channel, the second semiconductor region having a graded composition, the graded composition being graded from a first side of the second semiconductor region having a first composition consisting essentially of AlN to a second side of the second semiconductor region having a composition of BwAlxInyGazN, wherein w+x+y+z=1, wherein w is greater than or equal to zero, x is greater than or equal to 0.3, y is greater than or equal to zero, and z is greater than or equal to 0.
地址 Cambridge MA US