发明名称 Nonvolatile memory device using variable resistive element
摘要 A nonvolatile memory device utilizes a variable resistive element. The nonvolatile memory device includes a plurality of banks and first to third write global bit lines arranged to cross the plurality of banks. Each of the plurality of banks includes a plurality of nonvolatile memory cells using resistive material. The first, the second and the third write global bit lines are disposed directly adjacent to one another in order. When a write current is supplied to the first write global bit line during a write period, a fixed voltage is applied to the second write global bit line while the third global bit line floats.
申请公布号 US9336877(B2) 申请公布日期 2016.05.10
申请号 US201414504914 申请日期 2014.10.02
申请人 Samsung Electronics Co., Ltd. 发明人 Lee Jae-Yun;Woo-Jung Sun;Lee Kwang-Jin;Jeong Dong-Hoon;Cho Beak-Hyung
分类号 G11C8/08;G11C13/00;G11C7/02;G11C7/10;G11C7/18 主分类号 G11C8/08
代理机构 Volentine & Whitt, PLLC 代理人 Volentine & Whitt, PLLC
主权项 1. A nonvolatile memory device comprising: a plurality of banks including a plurality of nonvolatile memory cells, each nonvolatile memory cell being formed with resistive material; and first to third write global bit lines arranged to cross the plurality of banks and disposed directly adjacent to one another in order, wherein when a write current is supplied to the first write global bit line during a write period, a fixed voltage is applied to the second write global bit line and the third write global bit line floats, and wherein the write period is a read while write (RWW) period.
地址 Suwon-si, Gyeonggi-do KR