发明名称 |
Nonvolatile memory device using variable resistive element |
摘要 |
A nonvolatile memory device utilizes a variable resistive element. The nonvolatile memory device includes a plurality of banks and first to third write global bit lines arranged to cross the plurality of banks. Each of the plurality of banks includes a plurality of nonvolatile memory cells using resistive material. The first, the second and the third write global bit lines are disposed directly adjacent to one another in order. When a write current is supplied to the first write global bit line during a write period, a fixed voltage is applied to the second write global bit line while the third global bit line floats. |
申请公布号 |
US9336877(B2) |
申请公布日期 |
2016.05.10 |
申请号 |
US201414504914 |
申请日期 |
2014.10.02 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Lee Jae-Yun;Woo-Jung Sun;Lee Kwang-Jin;Jeong Dong-Hoon;Cho Beak-Hyung |
分类号 |
G11C8/08;G11C13/00;G11C7/02;G11C7/10;G11C7/18 |
主分类号 |
G11C8/08 |
代理机构 |
Volentine & Whitt, PLLC |
代理人 |
Volentine & Whitt, PLLC |
主权项 |
1. A nonvolatile memory device comprising:
a plurality of banks including a plurality of nonvolatile memory cells, each nonvolatile memory cell being formed with resistive material; and first to third write global bit lines arranged to cross the plurality of banks and disposed directly adjacent to one another in order, wherein when a write current is supplied to the first write global bit line during a write period, a fixed voltage is applied to the second write global bit line and the third write global bit line floats, and wherein the write period is a read while write (RWW) period. |
地址 |
Suwon-si, Gyeonggi-do KR |