发明名称 |
Event group extensions, systems, and methods |
摘要 |
An operating system uses non-bit aligned test masks to encode compound logical tests within the test mask. Generally, a bit within the test mask will indicate whether the test mask is a bit-aligned test mask or a non-bit-aligned test mask. If the system detects that the test mask in a non-bit-aligned test mask, the system will traverse the test mask to extract bit-aligned sub-masks and perform multi-level logical tests with the bit-aligned sub-masks. Such a system is particularly useful when performing a compound AND-OR logical test involving mutually exclusive event group flags. |
申请公布号 |
US9336072(B2) |
申请公布日期 |
2016.05.10 |
申请号 |
US201514617814 |
申请日期 |
2015.02.09 |
申请人 |
Moore Ralph |
发明人 |
Moore Ralph |
分类号 |
G06F11/00;G06F11/22 |
主分类号 |
G06F11/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. A non-transitory computer readable medium product configured to store software instructions that enable at least one processor in a computing device having a memory to execute the steps of:
encoding of an event group comprising adjacent bits within the memory of the computing device; encoding an event group test mask comprising bits representing a compound logical test targeting specific event group flags, wherein the test mask lacks bitwise alignment with respect to the event group bits; generating a test result for the compound logical test as a function of the event group test mask and the event group; and encoding the test result in the memory of the computing device. |
地址 |
Costa Mesa CA US |