发明名称 Method for producing a semiconductor layer sequence, radiation-emitting semiconductor chip and optoelectronic component
摘要 A method can be used for producing a semiconductor layer sequence, which is based on a nitride compound semiconductor material and which comprises a microstructured outer surface. The method has the following steps: A) growing at least one first semiconductor layer of the semiconductor layer sequence on a substrate; B) applying an etch-resistant layer on the first semiconductor layer; C) growing at least one further semiconductor layer on the layer sequence obtained in step B); D) separating the semiconductor layer sequence from the substrate, a separating zone of the semiconductor layer sequence being at least partly removed; E) etching the obtained separating surface of the semiconductor layer sequence by an etching means such that a microstructuring of the first semiconductor layer is carried out and the microstructured outer surface is formed.
申请公布号 US9337388(B2) 申请公布日期 2016.05.10
申请号 US201113878212 申请日期 2011.09.30
申请人 OSRAM OPTO SEMICONDUCTORS GMBH 发明人 Hertkorn Joachim;Taki Tetsuya;Off Jürgen
分类号 H01L21/00;H01L33/24;H01L33/22;H01L33/00;H01L33/16 主分类号 H01L21/00
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A method for producing a semiconductor layer sequence based on nitride compound semiconductor material and having a microstructured outer surface, the method comprising: growing a first semiconductor layer of the semiconductor layer sequence on a substrate; applying an etch stop layer on the first semiconductor layer in a manner that the etch stop layer completely covers the first semiconductor layer, the etch stop layer comprising silicon dioxide, silicon nitride, or magnesium nitride, and the etch stop layer having a thickness between 0.4 and 2 nm, inclusive; growing a further semiconductor layer on the semiconductor layer sequence obtained after applying the etching step layer, wherein the etch stop layer is configured to prevent etching of the further semiconductor layer; separating the semiconductor layer sequence from the substrate by at least partially removing a separating zone of the semiconductor layer sequence; and etching an obtained separating surface of the semiconductor layer sequence by use of an etchant, such that a microstructuring of the first semiconductor layer is effected and the microstructured outer surface is formed.
地址 Regensburg DE
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