发明名称 Conductor length measurement device and conductor length measurement method
摘要 Probes of a conductor length measurement device are connected to piping, and an output voltage is applied to the piping through the probes. A frequency spectrum curve is subsequently calculated by subjecting a voltage signal to FFT. Resonant frequencies of the piping are then determined from this frequency spectrum curve, and the total length of the piping is calculated on the basis of the resonant frequencies. The total length of the piping can therefore be easily measured without the need to install, for example, any measurement instruments at branch terminals.
申请公布号 US9335150(B2) 申请公布日期 2016.05.10
申请号 US201113816539 申请日期 2011.01.25
申请人 Mitsubishi Electric Corporation 发明人 Higuma Toshiyasu;Hibara Naoyuki;Gyota Tomoaki
分类号 G01R7/02;G01B7/02 主分类号 G01R7/02
代理机构 Posz Law Group, PLC 代理人 Posz Law Group, PLC
主权项 1. A conductor length measurement device, comprising: a measurement unit for measuring frequency characteristics of a coupled conductor by impressing a voltage to the conductor; and a computation unit for specifying resonant frequencies of the conductor from the frequency characteristics, and computing the total length L of the conductor by making a computation in accordance with the following estimation equation, with the conductor serving as a lossless line,L=300fw2⁢Σ⁢⁢fn+p·150fw, where fn represents the resonant frequencies, fw represents a frequency range and p represents the number of branches of the conductor, wherein an end of the conductor is short-circuited, and p is equal to or greater than two.
地址 Tokyo JP