发明名称 Chromatography system, signal processing apparatus, chromatography data processing apparatus, and program
摘要 A chromatography system has a multi-channel detection device including a flow cell, optics for directing light from light sources to the flow cell and outputting light that has passed through the flow cell, and a multi-channel detector. The optics has a function of dispersing light in wavelength in an optical path. The detector receives the light dispersed in wavelength. The multi-channel detection device also has a signal processing part connected to the detector. The chromatography system has a data processing apparatus. The signal processing circuit has a function of calculating an absorbance by absorbance=−log10(I/I0) using the intensity I of light having a wavelength to be measured that is outputted from the detector and a reference intensity I0 of light that is an average of intensities of light having different wavelengths that is produced at the same point of time as the light having a wavelength to be measured.
申请公布号 US9335308(B2) 申请公布日期 2016.05.10
申请号 US201414206801 申请日期 2014.03.12
申请人 JASCO Corporation 发明人 Yamaguchi Takayuki;Watabe Tomonari
分类号 G01N30/74;G01J1/04;G01N30/86;G01N21/05 主分类号 G01N30/74
代理机构 Osha Liang LLP 代理人 Osha Liang LLP
主权项 1. A chromatography system comprising: a flow cell to which a specimen is supplied; optics that directs light to the flow cell and outputs light that has passed through the flow cell, the optics having a function of wavelength dispersion of light; a multi-channel detector disposed at an output side of the optics, that receives respective wavelengths of the light dispersed by the optics; and a signal processing circuit provided in connection with the detector that obtains a chromatogram based on an intensity of light having a measuring wavelength to be measured that has been outputted from the detector, wherein the signal processing circuit corrects a baseline of the chromatogram based upon an average of intensities of light having a plurality of wavelengths that are detected simultaneously with the measuring wavelength and are longer than the measuring wavelength, wherein when correcting the baseline, the signal processing circuit calculates an absorbance by absorbance=−log 10(I/I0) where I is an intensity of light having a wavelength to be measured, and I0 is a reference intensity of light, the reference intensity of light is set based upon an average of intensities of light having a plurality of different wavelengths.
地址 Tokyo JP