发明名称 INSPECTION CHIP AND INSPECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an inspection chip and an inspection system that can allow an enhanced precision in sample or reagent quantification with a reduced possibility of air remaining in a quantification section.SOLUTION: An angle α is an acute angle formed by a first virtual surface 132K of a first retainer 132 forms with respect to a direction parallel to a communication direction R of a communication path 154. An angle β is an acute angle formed by a first wall surface 132A with respect to a direction parallel to the communication direction R. The angle α is larger than the angle β in the first retainer 132. An angle α is an acute angle formed by a first virtual surface 133K of a second retainer 133 with respect to a direction parallel to the communication direction R. An angle β is an acute angle formed by the first wall surface 133A with respect to the communication direction R. The angle α is larger than the angle β in the second retainer 133. Since the angle α is larger than the angle β in the second retainer 133, a reagent 18 of a predetermined reagent injection rate V0 to a reagent injector 131 is retained in the first retainer 132 and the second retainer 133.SELECTED DRAWING: Figure 4
申请公布号 JP2016070849(A) 申请公布日期 2016.05.09
申请号 JP20140202660 申请日期 2014.09.30
申请人 BROTHER IND LTD 发明人 OSHIKA YUMIKO;YOSHIMURA CHISATO
分类号 G01N35/08;G01N35/00 主分类号 G01N35/08
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