发明名称 |
METHOD FOR FORMING RESIST PATTERN, RESIST PATTERN SPLITTING AGENT, SPLIT PATTERN IMPROVING AGENT, AND RESIST PATTERN SPLIT MATERIAL |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for forming a resist pattern, and others.SOLUTION: The resist pattern forming method includes: a step A of forming a positive resist film on a support, exposing the positive resist film, and developing the resist film with an alkali to form a first resist pattern; a step B of applying a solution containing an acid or a thermoacid generator to cover the first resist pattern to form a first layer; a step C of applying a solution containing a solvent to cover the first layer; a step D of heating a structure including the first resist pattern obtained in the above steps A to C to change the solubility of the first resist pattern with a developer by an action of the acid in the first layer; and a step E of developing the coated first resist pattern with an organic solvent to remove a region other than the region where the solubility of the first resist pattern with the developer is changed, so as to form a second resist pattern.SELECTED DRAWING: None |
申请公布号 |
JP2016071345(A) |
申请公布日期 |
2016.05.09 |
申请号 |
JP20150172101 |
申请日期 |
2015.09.01 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
HORI YOICHI;WATABE RYOJI;TSUNODA RIKITA |
分类号 |
G03F7/40;G03F7/20;H01L21/027 |
主分类号 |
G03F7/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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