| 摘要 |
PROBLEM TO BE SOLVED: To provide an article inspection device capable of reducing the period from the occurrence of an abnormality to the solution, by selecting an abnormality handling method on the basis of the device state and an external environment.SOLUTION: The article inspection device includes: a display operation unit 4 for displaying various values, such as a set value when the type of an inspection object W is set, a set value related to the change of operation mode, a command value when a command operation is performed, and various determination results; an abnormality detection unit 81 for detecting an abnormality of each component of the device; and a handling method guide unit 82. When an abnormality of a component of the device is detected and there are a plurality of causes corresponding to the detected abnormality, the handling method guide unit displays the handling methods on the display operation unit 4 in the descending order from the handling method whose preset weighting value is largest.SELECTED DRAWING: Figure 1 |
