| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which can simplify processing of an inspection device and reduce an inspection time.SOLUTION: A semiconductor device 1 includes a DAC (Digital Analog converter) 3 which outputs a voltage corresponding to a provided control value and a control part 5 which provides the control value to the DAC 3. The control part 5 receives an initial value of a control value provided from an external inspection device 7 to the DAC 3 by a reception function of receiving the initial value, and changes the initial value by a change function of changing the initial value depending on change instructions input from the external inspection device 7, and creates a new control value provided to the DAC 3.SELECTED DRAWING: Figure 1 |
