发明名称 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING MEANS
摘要 PROBLEM TO BE SOLVED: To efficiently remove chemical atmosphere on a substrate.SOLUTION: In a substrate processing apparatus 1, when a shield plate movement mechanism 53, a chemical supply part and a substrate rotation mechanism 35 are controlled by a control part 71, a chemical is supplied to a top face 91 of a substrate 9 and a chemical treatment is performed in a state where a top plate 51 is located at a first relative position in a vertical direction with respect to the substrate 9. And a washing fluid is supplied to the top face 91 of the substrate 9 and a washing treatment is performed in a state where the top plate 51 is located at a second relative position closer to the substrate 9 than the first relative position. Further, the substrate 9 is rotated and a drying treatment is performed on the substrate 9 in a state where the top plate 51 is located at a third relative position closer to the substrate 9 than the second relative position. By doing this, a chemical atmosphere on the substrate 9 can be efficiently removed during the washing treatment. As a result, generation of particles caused by the chemical atmosphere on the substrate 9 can be inhibited in the drying treatment.SELECTED DRAWING: Figure 1
申请公布号 JP2016072343(A) 申请公布日期 2016.05.09
申请号 JP20140198208 申请日期 2014.09.29
申请人 SCREEN HOLDINGS CO LTD 发明人 TOKURI KENTAROU;TAKAHASHI HIROAKI
分类号 H01L21/304;H01L21/027;H01L21/306 主分类号 H01L21/304
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