发明名称 RADIATION IMAGE ANALYSIS DEVICE, METHOD AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide a radiation image analysis device, method and program, which can automatically and stably obtain a distance (SID value) from a radiation source to a radiation detector.SOLUTION: A radiation image analysis device acquires a distance (SOD value) from a radiation source to a subject, acquires distance dependent information which is obtained on a radiation image and changes in accordance with an SID value, obtains the temporary thickness of the subject by substituting the SOD value as the SID value, and substituting the distance dependent information corresponding to the first information into a first function representing the correspondence between the first information consisting of at least one distance dependent information, the SID value and the thickness of the subject, obtains the temporary SID value by adding the SOD value to the temporary thickness. The device then obtains the thickness of the subject by substituting the temporary SID value as the SID value and substituting the distance dependent information corresponding to the second information into the second function representing the correspondence between the second information consisting of at least one distance dependent information, the SID value and the thickness of the subject, and obtains the SID value by adding the SOD value to the thickness of the subject.SELECTED DRAWING: Figure 4
申请公布号 JP2016067590(A) 申请公布日期 2016.05.09
申请号 JP20140199996 申请日期 2014.09.30
申请人 FUJIFILM CORP 发明人 NAITO SATOSHI;KAWAMURA TAKAHIRO
分类号 A61B6/00 主分类号 A61B6/00
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