| 摘要 |
A method for signal delay in test mode comprises, in a scan mode, delaying a scan signal in a scan path (fig. 1) by propagating the scan signal through a plurality of delay devices (125a, 125b, 125c) coupled in series, wherein a first one of the delay devices is powered by a first voltage, a second one of the delay devices is powered by a second voltage, and the second voltage is greater than the first voltage. The method also comprises, in a functional mode, disabling the delay devices. |
