| 摘要 |
A range-pattern-matching-type DRC-based process hotspot detection is provided that considers edge tolerances and incomplete specification ("don't care") regions in foundry-provided hotspot patterns. First, all possible topological patterns are enumerated for the foundry-provided hotspot pattern. Next, critical topological features are extracted from each pattern topology and converted to critical design rules using Modified Transitive Closure Graphs (MTCGs). Third, the extracted critical design rules are arranged in an order that facilitates searching space reduction techniques, and then the DRC process is sequentially repeated on a user' s entire layout pattern for each critical design rule in a first group, then searching space reduction is performed to generate a reduced layout pattern, and then DRC process is performed for all remaining critical design rules using the reduced layout pattern. Candidate locations are then identified using the DRC results, and then the true hotspot locations are confirmed using longest common subsequence and linear scan techniques. |
