发明名称 SYSTEM FOR ANALYSIS OF A MICROWAVE FREQUENCY SIGNAL BY IMAGING
摘要 The invention relates to a system (10) for analysis of a microwave frequency signal (HF) by imaging, comprising: - a solid material (M) having at least one optical property that is modifiable in at least one zone (Zo) of said material when said zone is simultaneously in the presence of an optical excitation (Eo) or electrical excitation (Ee) and a microwave frequency signal having at least one frequency coincident with a resonance frequency (fR) of the material, said material also having the property that a value of said resonance frequency (fR(B)) varies as a function of the amplitude of a magnetic field, - a magnetic field generator (GB) configured to generate a magnetic field (B) having, inside a part of said zone, a spatial amplitude variation (B(x)) along a direction X, said material therefore having a resonance frequency (fR(x)) function of a position (x) along said direction X, and - a detector (D) configured to receive an image (Im) of said zone (Zo) along said direction X.
申请公布号 WO2016066532(A1) 申请公布日期 2016.05.06
申请号 WO2015EP74544 申请日期 2015.10.22
申请人 THALES;UNIVERSITAET LEIPZIG 发明人 CHIPAUX, MAYEUL;TORAILLE, LOÏC;DEBUISSCHERT, THIERRY;LARDAT, CHRISTIAN;MORVAN, LOIC;MEIJER, JAN;PEZZAGNA, SÉBASTIEN
分类号 G01R23/17;G01R23/163 主分类号 G01R23/17
代理机构 代理人
主权项
地址