| 摘要 |
A data storage device (DSD) tester for testing a DSD is disclosed. The DSD tester comprises a plurality of bays, a screen, and control circuitry operable to detect when a first DSD has been inserted into a first bay. Independent of operator input, a graphical user interface (GUI) displayed on the screen is automatically updated to reflect the first DSD has been inserted into the first bay. Independent of operator input, a DSD test is automatically executed on the first DSD. When the first DSD is removed from the first bay, independent of operator input, the GUI is automatically updated to reflect the first DSD has been removed from the first bay. |
