| 摘要 |
Disclosed are a method and a device for minimizing scan test time. A device for minimizing scan test time divides a plurality of scan patterns into two or more scan sections, acquires, with respect to each scan section, a first shift frequency in which an output pattern of a scan chain differs from a prediction pattern by means of increase and decrease of shift frequencies, and then determines a second shift frequency, which is smaller than the first shift frequency, as a shift frequency of each scan section. |
