| 发明名称 |
EXPORTING MEASUREMENTS OF NANOPORE ARRAYS |
| 摘要 |
A method of exporting measurements of a nanopore sensor on a nanopore based sequencing chip is disclosed. An electrical characteristic associated with the nanopore sensor is measured. The electrical characteristic associated with the nanopore sensor is processed. A summary for the electrical characteristic and one or more previous electrical characteristics is determined. The summary for the electrical characteristic and the one or more previous electrical characteristics are exported. Determining the summary includes determining that the electrical characteristic and at least a portion of the one or more previous electrical characteristics correspond to a base call event at the nanopore sensor. The summary represents the electrical characteristic and the at least a portion of the one or more previous electrical characteristics. |
| 申请公布号 |
US2016123923(A1) |
申请公布日期 |
2016.05.05 |
| 申请号 |
US201414534042 |
申请日期 |
2014.11.05 |
| 申请人 |
Genia Technologies, Inc. |
发明人 |
Chen Roger J.A.;Tian Hui;Fernandez-Gomez Santiago |
| 分类号 |
G01N27/447;G01N33/487;C12Q1/68 |
主分类号 |
G01N27/447 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of exporting measurements of a nanopore sensor on a nanopore based sequencing chip, comprising:
measuring an electrical characteristic associated with the nanopore sensor; processing the electrical characteristic associated with the nanopore sensor; determining a summary for the electrical characteristic and one or more previous electrical characteristics; and exporting the summary for the electrical characteristic and the one or more previous electrical characteristics. |
| 地址 |
Mountain View CA US |
