发明名称 PROTECTION CIRCUIT OF SEMICONDUCTOR DEVICE
摘要 A protection circuit of a semiconductor device includes a high electron mobility transistor and a protection element. Between the drain and the gate of the high electron mobility transistor, the protection element includes: a thyristor; and a first resistor connected in series to the thyristor. Between the source and the gate of the high electron mobility transistor, the protection element includes: a second resistor and an interrupter that is connected in series to the second resistor. The interrupter interrupts a flow of a current between the drain and the gate when the thyristor is turned off, and the interrupter permits the current to flow between the drain and the gate when the thyristor is turned on.
申请公布号 US2016126723(A1) 申请公布日期 2016.05.05
申请号 US201414894710 申请日期 2014.05.28
申请人 DENSO CORPORATION 发明人 OYAMA Kazuhiro
分类号 H02H7/00;H01L29/778;H01L29/74;H01L27/02 主分类号 H02H7/00
代理机构 代理人
主权项 1. A protection circuit of a semiconductor device, comprising: a high electron mobility transistor as a semiconductor switching element that is connected to a load and turns on or off an electric power supply to the load; and a protecting element that includes: a thyristor connected in a forward direction and a first resistor connected in series to the thyristor between a drain and a gate of the high electron mobility transistor; anda second resistor and an interrupter connected in series to the second resistor between a source and the gate of the high electron mobility transistor, wherein the interrupter interrupts a flow of a current between the drain and the gate of the high electron mobility transistor when the thyristor is turned off, and wherein the interrupter permits the flow of the current between the drain and the gate of the high electron mobility transistor when the thyristor is turned on.
地址 Kariya-city JP