发明名称 |
FULLERENE DERIVATIVE AND N-TYPE SEMICONDUCTOR MATERIAL |
摘要 |
The present invention is a material having excellent performance as an n-type semiconductor material, in particular for organic thin-film solar cells.;The present invention provides an n-type semiconductor consisting of a fullerene derivative having a purity of 99% or more, the fullerene derivative being represented by formula (1):;wherein ring A represents C60 fullerene;R1 represents a hydrogen atom, alkyl optionally having at least one substituent, or aryl optionally having at least one substituent; andAr represents aryl optionally substituted with at least one alkyl group. |
申请公布号 |
US2016126462(A1) |
申请公布日期 |
2016.05.05 |
申请号 |
US201414891416 |
申请日期 |
2014.05.16 |
申请人 |
DAIKIN INDUSTRIES, LTD. ;OSAKA UNIVERSITY |
发明人 |
NAGAI Takabumi;ADACHI Kenji;ASO Yoshio;IE Yutaka;KARAKAWA Makoto |
分类号 |
H01L51/00;C07D209/70 |
主分类号 |
H01L51/00 |
代理机构 |
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代理人 |
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主权项 |
1. An n-type semiconductor material consisting of a fullerene derivative having a purity of 99% or more as defined below, the fullerene derivative being represented by formula (1): wherein ring A represents C60 fullerene; R1 represents a hydrogen atom, alkyl optionally having at least one substituent, or aryl optionally having at least one substituent; and Ar represents aryl optionally substituted with at least one alkyl group, the purity being defined by the following equation:
Purity (%)=100−Dmax (%) wherein the Dmax is the maximum value among the absolute value of the difference between an analysis value and a theoretical value obtained in elemental analysis of carbon, the absolute value of the difference between an analysis value and a theoretical value obtained in elemental analysis of hydrogen, and the absolute value of the difference between an analysis value and a theoretical value obtained in elemental analysis of nitrogen. |
地址 |
Osaka JP |