发明名称 METHOD FOR INSPECTING TOUCH-PANEL ELECTRODE SUBSTRATE
摘要 Provided is a method for inspecting a touch panel with which method it is possible to perform an inspection with high accuracy and to allow an improvement in yield. A drive signal is supplied to either one of sensor electrodes (12) and an inspection electrode (142), a plurality of sense signals related to the respective sensor electrodes (12) are obtained from the other of the sensor electrodes and the inspection electrode, and conditions of the sensor electrodes (12) are determined according to the sense signals.
申请公布号 US2016124575(A1) 申请公布日期 2016.05.05
申请号 US201414889637 申请日期 2014.02.27
申请人 SHARP KABUSHIKI KAISHA 发明人 YASHIRO Yuhji;YOSHIMURA Kazuya;HAYASHI Shogo;KIDA Kazutoshi;MATSUMOTO Shinji;MARUYAMA Takenori;OHMORI Tsuyoshi;YASUTA Akira
分类号 G06F3/041;G06F3/0488;G06F3/044 主分类号 G06F3/041
代理机构 代理人
主权项 1. A method for inspecting a touch-panel electrode substrate which includes a plurality of sensor electrodes extending in a substantially same direction, said method comprising the steps of: (I) supplying a drive signal to either one of the plurality of sensor electrodes and at least one inspection electrode in a state where capacitances are formed between the plurality of sensor electrodes and the at least one inspection electrode; (II) obtaining a plurality of sense signals from the other one of the plurality of sensor electrodes and the at least one inspection electrode, the plurality of sense signals being generated according to the drive signal and the capacitances, and the plurality of sense signals being related to the respective plurality of sensor electrodes; and (III) determining conditions of the plurality of sensor electrodes according to the plurality of sense signals.
地址 Osaka-shi, Osaka JP