发明名称 |
SUBSTRATE PROCESSING APPARATUS, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND SUBSTRATE PROCESSING METHOD |
摘要 |
A substrate processing apparatus includes a substrate having an SiGe film or Ge film exposed on at least a portion of a surface thereof, a process chamber configured to process the substrate, an etching gas supply part configured to supply an etching gas into the process chamber, a deposition gas supply part configured to supply gas containing at least an Si-containing gas as a deposition gas into the process chamber, and a control part configured to control the deposition gas supply part and the etching gas supply part so as to remove a Ge oxide film formed on a surface of the SiGe film or the Ge film by supplying the etching gas and to epitaxially grow an Si-containing film on at least the SiGe film or the Ge film by supplying the Si-containing gas after removing the Ge oxide film by the supply of the etching gas. |
申请公布号 |
US2016126337(A1) |
申请公布日期 |
2016.05.05 |
申请号 |
US201414894620 |
申请日期 |
2014.05.29 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
TOMINARI Tatsuya;MORIYA Atsushi;ISHIBASHI Kiyohisa |
分类号 |
H01L29/66;C23C16/24;H01L21/02;C23C16/44;C23C16/52;H01L21/3065;C23C16/46;C23C16/02 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A substrate processing apparatus, comprising:
a process chamber configured to process a substrate having an SiGe film or a Ge film exposed on at least a portion of a surface of the substrate; an etching gas supply part configured to supply an etching gas into the process chamber; a deposition gas supply part configured to supply gas containing at least an Si-containing gas as a deposition gas into the process chamber; and a control part configured to control the deposition gas supply part and the etching gas supply part so as to remove a Ge oxide film formed on a surface of the SiGe film or the Ge film by supplying the etching gas and to epitaxially grow an Si-containing film on at least the SiGe film or the Ge film by supplying the Si-containing gas after removing the Ge oxide film by the supply of the etching gas. |
地址 |
Tokyo JP |