发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 According to one embodiment, a semiconductor memory device includes a substrate that includes a first region and a second region; a stacked body that is disposed on the first region of the substrate and includes a plurality of first metal layers and a plurality of voids each of which is disposed between the plurality of first metal layers; a columnar portion that penetrates the stacked body, extends in a direction of stacking in the stacking body; a transistor that is disposed on the second region; and the interconnect portion that is disposed on the transistor and includes the plurality of first metal layers and a plurality of second metal layers each of which is disposed between the plurality of first metal layers. The transistor is electrically connected to the channel body or the first metal layer of the stacked body through a interconnect portion.
申请公布号 US2016126251(A1) 申请公布日期 2016.05.05
申请号 US201514601384 申请日期 2015.01.21
申请人 Kabushiki Kaisha Toshiba 发明人 FUJITA Masanari;FUKUZUMI Yoshiaki
分类号 H01L27/115;H01L29/49 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor memory device comprising: a substrate; a stacked body provided on the substrate and including a plurality of electrode layers separately stacked each other; a transistor provided on the substrate; and the interconnect portion electrically connected to the transistor and including a plurality of first metal layers separately stacked each other and a plurality of second metal layers provided between the plurality of first metal layers, the plurality of first metal layer having a same material as the plurality of electrode layer.
地址 Minato-ku JP