发明名称 RESISTIVE MEMORY DEVICE AND OPERATING METHOD
摘要 Provided are a resistive memory device including a plurality of memory cells, and a method of operating the resistive memory device. The resistive memory device includes a sensing circuit connected to a first signal line, to which a memory cell is connected, the sensing circuit sensing data stored in the memory cell based on a first reference current; and a reference time generator for generating a reference time signal that determines a time point when a result of the sensing is to be output, based on the first reference current.
申请公布号 US2016125939(A1) 申请公布日期 2016.05.05
申请号 US201514806780 申请日期 2015.07.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK HYUN-KOOK;LEE YEONG-TAEK;BYEON DAE-SEOK;KIM BO-GEUN
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
主权项 1. A resistive memory device comprising: a memory cell array including a memory cell connected to a first signal line and a second signal line; a sensing circuit connected to the first signal line, wherein the sensing circuit senses data stored in the memory cell based on a first reference current flowing through the first signal line; and a reference time generator that generates a reference time signal that determines a time at which the sensing of the stored data occurs based on the first reference current.
地址 SUWON-SI KR