发明名称 |
RESISTIVE MEMORY DEVICE AND OPERATING METHOD |
摘要 |
Provided are a resistive memory device including a plurality of memory cells, and a method of operating the resistive memory device. The resistive memory device includes a sensing circuit connected to a first signal line, to which a memory cell is connected, the sensing circuit sensing data stored in the memory cell based on a first reference current; and a reference time generator for generating a reference time signal that determines a time point when a result of the sensing is to be output, based on the first reference current. |
申请公布号 |
US2016125939(A1) |
申请公布日期 |
2016.05.05 |
申请号 |
US201514806780 |
申请日期 |
2015.07.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK HYUN-KOOK;LEE YEONG-TAEK;BYEON DAE-SEOK;KIM BO-GEUN |
分类号 |
G11C13/00 |
主分类号 |
G11C13/00 |
代理机构 |
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代理人 |
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主权项 |
1. A resistive memory device comprising:
a memory cell array including a memory cell connected to a first signal line and a second signal line; a sensing circuit connected to the first signal line, wherein the sensing circuit senses data stored in the memory cell based on a first reference current flowing through the first signal line; and a reference time generator that generates a reference time signal that determines a time at which the sensing of the stored data occurs based on the first reference current. |
地址 |
SUWON-SI KR |