| 发明名称 |
METHOD OF MEASURING CHARACTERISTICS OF CRYSTAL UNIT |
| 摘要 |
A method of measuring characteristics of a crystal unit, includes: driving a crystal unit having a cover transmitting light, a crystal substrate, a first excitation electrode disposed on a first surface of the crystal substrate facing the cover, and a second excitation electrode disposed on a second surface of the crystal substrate opposite to the first surface; irradiating light to the first excitation electrode through the cover in the driving state of the crystal unit; and measuring vibration characteristics of the crystal unit based on reflected light obtained from the irradiated light. |
| 申请公布号 |
US2016123797(A1) |
申请公布日期 |
2016.05.05 |
| 申请号 |
US201514875988 |
申请日期 |
2015.10.06 |
| 申请人 |
FUJITSU LIMITED |
发明人 |
KISHI Masakazu;Kubota Hajime;ITOH Masayuki |
| 分类号 |
G01H9/00 |
主分类号 |
G01H9/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of measuring characteristics of a crystal unit, comprising:
driving a crystal unit having a cover transmitting light, a crystal substrate, a first excitation electrode disposed on a first surface of the crystal substrate facing the cover, and a second excitation electrode disposed on a second surface of the crystal substrate opposite to the first surface; irradiating light to the first excitation electrode through the cover in the driving state of the crystal unit; and measuring vibration characteristics of the crystal unit based on reflected light obtained from the irradiated light. |
| 地址 |
Kawasaki-shi JP |
