发明名称 ILLUMINATION SYSTEM, INSPECTION TOOL WITH ILLUMINATION SYSTEM, AND METHOD OF OPERATING AN ILLUMINATION SYSTEM
摘要 An illumination system, an inspection tool and a method for inspecting an object are disclosed. A configurable area light source is arranged in an illumination optical axis of an illumination beam path, wherein the configurable area light source is configured such that different beam diameters are settable. At least one illumination lens is positioned in the illumination beam path for directing a collimated beam at least onto a field of view on a surface of the object, wherein a value of an angle of incidence of the illumination optical axis of the illumination beam path equals a value of an angle of reflectance of the imaging optical axis of the imaging beam path. The invention allows the combination of the functionality of a wide angle coaxial illumination and a collimated coaxial illumination in one illumination system.
申请公布号 US2016123892(A1) 申请公布日期 2016.05.05
申请号 US201514984833 申请日期 2015.12.30
申请人 KLA-Tencor Corporation 发明人 Cauwenberghs Filip;DeGreeve Johan;Begoc Pauline;Goorman Koen
分类号 G01N21/88;H04N5/225;F21V14/00;F21V5/04;F21V23/00 主分类号 G01N21/88
代理机构 代理人
主权项 1. An illumination system for collimated illumination, comprising: a configurable area light source arranged in an illumination optical axis of an illumination beam path, wherein the configurable area light source is configured such that different beam diameters are settable; an imaging optical axis of an imaging beam path; and at least one illumination lens positioned in the illumination beam path for directing a collimated beam onto a field of view on a surface of an object, wherein a value of an angle of incidence of the illumination optical axis of the illumination beam path equals a value of an angle of reflectance of the imaging optical axis of the imaging beam path.
地址 Milpitas CA US