发明名称 |
METHODS AND APPARATUS TO CORRECT SEGMENTATION ERRORS |
摘要 |
Methods, apparatus, systems and articles of manufacture are disclosed to correct segmentation errors. An example disclosed method includes identifying, with a processor, a segment group comprising observation data associated with two or more segments, respective ones of the two or more segments having a similar first characteristic and a dissimilar second characteristic, identifying first portions of the observation data having errors, generating a first matrix of binary indicators associated with the observation data, the binary indicators associating the first portions of the observation data with a first correction factor, and generating a value for the first correction factor by minimizing a residual sum of squares of the segment group observation data associated with the first matrix of binary indicators. |
申请公布号 |
US2016125439(A1) |
申请公布日期 |
2016.05.05 |
申请号 |
US201414529409 |
申请日期 |
2014.10.31 |
申请人 |
The Nielsen Company (US), LLC |
发明人 |
Sheppard Michael;Lipa Peter;Terrazas Alejandro;Xie Wei;Reid Matthew |
分类号 |
G06Q30/02 |
主分类号 |
G06Q30/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method to correct a misclassification error in segment data, comprising:
identifying, with a processor, a segment group comprising observation data associated with two or more segments, respective ones of the two or more segments exhibiting a shared behavior characteristic and a dissimilar classification characteristic; identifying first portions of the observation data exhibiting errors; generating a first matrix of binary indicators associated with the observation data, the binary indicators associating the first portions of the observation data with a first correction factor; generating a value for the first correction factor by minimizing a residual sum of squares of the segment group observation data associated with the first matrix of binary indicators; and correcting the misclassification error by applying the first correction factor to the observation data based on the first matrix of binary indicators. |
地址 |
Schaumburg IL US |