发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR THE SEMICONDUCTOR DEVICE
摘要 A semiconductor device includes first and second semiconductor elements and first and second conductive members. A first electrode on the first semiconductor element is bonded to a first stack part of the first conductive member by a first bonding layer. A second electrode on the second semiconductor element is bonded to a second stack part of the second conductive member by a second bonding layer. A first joint part of the first conductive member is bonded to a second joint part of the second conductive member by an intermediate bonding layer. A first surface of the first joint part facing the second joint part, a side surface of the first joint part continuous from the first surface, a second surface of the second joint part facing the first joint part, and a side surface of the second joint part continuous from the second surface are covered by nickel layers.
申请公布号 US2016126205(A1) 申请公布日期 2016.05.05
申请号 US201514930816 申请日期 2015.11.03
申请人 TOYOTA JIDOSHA KABUSHIKI KAISHA 发明人 KADOGUCHI Takuya
分类号 H01L23/00 主分类号 H01L23/00
代理机构 代理人
主权项 1. A semiconductor device comprising: a first semiconductor element; and a second semiconductor element electrically connected to the first semiconductor element by a first conductive member and a second conductive member, wherein a first electrode is arranged on a surface of the first semiconductor element, a second electrode is arranged on a surface of the second semiconductor element, the first conductive member has a first stack part stacked to the first semiconductor element to face the first electrode, and a first joint part extending from the first stack part, the second conductive member has a second stack part stacked to the second semiconductor element to face the second electrode, and a second joint part, the second joint part extending from the second stack part and facing the first joint part, the first electrode and the first stack part are bonded to each other by a first bonding layer, the second electrode and the second stack part are bonded to each other by a second bonding layer, the first joint part and the second joint part are bonded to each other by an intermediate bonding layer, an area of the intermediate bonding layer is smaller than both an area of the first bonding layer and an area of the second bonding layer when seen in a direction perpendicular to a bonded surface of the intermediate bonding layer, and a first surface of the first joint part facing the second joint part, a side surface of the first joint part continuous from the first surface, a second surface of the second joint part facing the first joint part, and a side surface of the second joint part continuous from the second surface are covered by nickel layers.
地址 Toyota-shi JP