| 摘要 |
Heating arrangement for a materials testing device (100), the materials testing device (100) comprising at least one surface measurement probe (11) adapted to be brought into contact with a surface of a sample (120), the heating arrangement comprising a probe heater (1a) comprising:
- an infrared emitting element (3) adapted to emit infrared radiation;
- a reflector (5) having a reflective surface (15a) arranged to direct said infrared radiation towards a distal end of said surface measurement probe (11). According to the invention, the reflector comprises a first focal point (7) and a second focal point (9), the infrared emitting element (3) being situated substantially at said first focal point (7). |
