发明名称 Measurement frequency variable ultrasonic imaging device
摘要 An ultrasonic imaging device includes an ultrasonic probe including a piezoelectric device transmitting ultrasonic waves to a sample and receiving echo waves, an X axis scanner and a Y axis scanner scanning the sample and positions the probe at a scanning position, a frequency controller controlling a frequency of a received signal in accordance with the position of the scanning position, a signal processing unit processing the received signal, and an image generator generating an ultrasonic wave image at the frequency based on an output of the signal processing unit. The frequency controller generates and supplies a burst signal having a predetermined frequency by a burst wave oscillator to the piezoelectric device of the ultrasonic probe to generate the ultrasonic waves having a predetermined frequency.
申请公布号 US9326752(B2) 申请公布日期 2016.05.03
申请号 US201313945548 申请日期 2013.07.18
申请人 Hitachi Power Solutions Co., Ltd. 发明人 Umeda Masamichi;Kitami Kaoru;Sugaya Natsuki;Takada Masafumi
分类号 A61B8/00;A61B8/14 主分类号 A61B8/00
代理机构 Crowell & Moring LLP 代理人 Crowell & Moring LLP
主权项 1. A measurement frequency variable ultrasonic imaging device comprising: an ultrasonic probe including a piezoelectric device transmitting ultrasonic waves to a sample and receiving ultrasonic waves reflected, scattered, and refracted by the sample to output a received signal; a scanner scanning the sample with the ultrasonic probe and positioning the ultrasonic probe at a predetermined scanning position in a Y direction after scanning in an X direction by one line; a frequency controller controlling a frequency of the received signal at a predetermined frequency in accordance with the scanning position in the Y direction of the probe, the predetermined frequency being varied stepwise; a signal processing unit processing the received signal; and an image generator generating an ultrasonic wave image with the predetermined frequency varied stepwise in accordance with the scanning position in the Y direction on the basis of an output signal of the signal processing unit.
地址 Hitachi-shi JP