发明名称 Semiconductor structure and manufacturing method thereof
摘要 The present disclosure provides a method of manufacturing a semiconductor structure. The method includes forming a first mask on a substrate; defining a first doped region through an opening of the first mask; forming a second mask on the first mask and filling in the opening of the first mask with the second mask; defining a second doped region through an opening of the second mask; and stripping the first mask and the second mask from the substrate. The present disclosure provides a semiconductor structure, including a substrate having a top surface; a first doped region having a first surface; and a second doped region having a second surface. The first surface and the second surface are coplanar with the top surface of the substrate. Either of the doped regions has a monotonically decreasing doping profile from the top surface of the substrate to a bottom of the doped region.
申请公布号 US9331081(B2) 申请公布日期 2016.05.03
申请号 US201314068646 申请日期 2013.10.31
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. 发明人 Lin Chun-Ming;Chung Chiu-Hua;Lin Yu-Shine;Lai Bor-Wen;Lee Tsung-Lin
分类号 H01L21/76;H01L21/82;H01L27/092;H01L29/66;H01L21/8238 主分类号 H01L21/76
代理机构 WPAT, P.C., Intellectual Property Attorneys 代理人 WPAT, P.C., Intellectual Property Attorneys ;King Anthony
主权项 1. A method of manufacturing a semiconductor structure, comprising: forming a first mask on a substrate; defining a first doped region through an opening of the first mask; forming a second mask on the first mask and filling in the opening of the first mask with the second mask; defining a second doped region through an opening of the second mask, the opening of the second mask simultaneously exposing the underlying first mask; and stripping the first mask and the second mask from the substrate.
地址 Hsinchu TW