发明名称 |
Method for manufacturing a die assembly having a small thickness and die assembly relating thereto |
摘要 |
A method for manufacturing a die assembly, including the steps of: bonding a first wafer of semiconductor material to a second wafer, the second wafer including a respective semiconductor body having a respective initial thickness and forming an integrated electronic circuit; and subsequently reducing the initial thickness of the semiconductor body of the second wafer; and subsequently bonding the second wafer to a third wafer, the third wafer forming a micro-electromechanical sensing structure. |
申请公布号 |
US9327964(B2) |
申请公布日期 |
2016.05.03 |
申请号 |
US201414524661 |
申请日期 |
2014.10.27 |
申请人 |
STMicroelectronics S.r.l. |
发明人 |
Allegato Giorgio;Ferrera Marco;Garavaglia Matteo;Corso Lorenzo |
分类号 |
B81B7/00;B81C1/00 |
主分类号 |
B81B7/00 |
代理机构 |
Seed IP Law Group PLLC |
代理人 |
Seed IP Law Group PLLC |
主权项 |
1. A die assembly comprising:
a first die including a semiconductor body and an integrated electronic circuit and having first and second sides that extend between first and second surfaces; a recess formed in the first surface of the first die; a second die of semiconductor material bonded to the second surface of the first die, the second die not including electrical functions and providing stiffening structural support to the first die; a third die bonded to the first surface of the first die, the first die being arranged between the second and third dice, the third die including a micro-electromechanical sensing structure; and a molding compound coating the first and second sides of the first die. |
地址 |
Agrate Brianza IT |