Electrically conductive Kelvin contacts for microcircuit tester

摘要

Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin.

主权项

1. A device for forming a plurality of temporary mechanical and electrical connections between a device under test (DUT) having a plurality of terminals, comprising:
a plurality of electrically conductive force contacts extending toward a device under test and being deflectable, each force contact in the plurality being laterally arranged to correspond to one terminal; said force contacts being a plurality of vertically oriented spaced spring biased pins, each pin including a contact point aligned to engage said terminals on a portion of the terminal which is not orthogonal to the terminal and a plurality of electrically conductive sense contacts, each sense contact in the plurality being laterally arranged to correspond to one force contact and one terminal, each sense contact in the plurality extending toward the device under test proximate the corresponding force contact; wherein each sense contact in the plurality includes a freely movable portion extending resiliently toward device under test wherein the sense contact is laterally separated from the corresponding force contact; and wherein the free portion includes an aperture at its distal end that is spaced sufficiently to allow passage the force contact.