发明名称 |
Variable resistance memory device and method of manufacturing the same |
摘要 |
A variable resistance memory device includes a semiconductor substrate having a vertical transistor with a shunt gate that increases an area of a gate of the vertical transistor. |
申请公布号 |
US9331124(B2) |
申请公布日期 |
2016.05.03 |
申请号 |
US201514617607 |
申请日期 |
2015.02.09 |
申请人 |
SK Hynix Inc. |
发明人 |
Park Nam Kyun |
分类号 |
H01L29/788;H01L27/108;H01L27/24;H01L27/10;H01L29/78;H01L45/00;H01L29/423;H01L29/66 |
主分类号 |
H01L29/788 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A method of manufacturing a variable resistance memory device, the method comprising:
forming a plurality of vertical transistors extending from a surface of a semiconductor substrate in a direction perpendicular to the length and the width of the semiconductor substrate, each of the plurality of vertical transistors including a pillar and a gate surrounding a lower portion of the pillar; forming a first spacer and a second spacer on a side wall of the pillar; forming an insulating layer between the plurality of vertical transistors; defining a space by removing the second spacer and an upper portion of the insulating layer; and providing a conductive material in the space to form a shunt gate. |
地址 |
Gyeonggi-do KR |