发明名称 Variable resistance memory device and method of manufacturing the same
摘要 A variable resistance memory device includes a semiconductor substrate having a vertical transistor with a shunt gate that increases an area of a gate of the vertical transistor.
申请公布号 US9331124(B2) 申请公布日期 2016.05.03
申请号 US201514617607 申请日期 2015.02.09
申请人 SK Hynix Inc. 发明人 Park Nam Kyun
分类号 H01L29/788;H01L27/108;H01L27/24;H01L27/10;H01L29/78;H01L45/00;H01L29/423;H01L29/66 主分类号 H01L29/788
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A method of manufacturing a variable resistance memory device, the method comprising: forming a plurality of vertical transistors extending from a surface of a semiconductor substrate in a direction perpendicular to the length and the width of the semiconductor substrate, each of the plurality of vertical transistors including a pillar and a gate surrounding a lower portion of the pillar; forming a first spacer and a second spacer on a side wall of the pillar; forming an insulating layer between the plurality of vertical transistors; defining a space by removing the second spacer and an upper portion of the insulating layer; and providing a conductive material in the space to form a shunt gate.
地址 Gyeonggi-do KR