APPARATUS AND METHOD USING PROGRAMMABLE RELIABILITY AGING TIMER

摘要

Disclosed in the present invention are a device using a programmable reliability aging timer and a method thereof. The device includes: a function circuit which performs the function of an integrated circuit (IC); a memory unit in which the life time of the IC is stored; a control unit which sets aging target conditions according to the life time stored in the memory unit; and a reliability aging timer (RAT) which applies stresses to a test pattern according to the aging target conditions, detects the result of the stresses, and determines deterioration of the IC. The RAT refreshes the operation of the function circuit if the deterioration of the IC is determined before the life time of the IC as a result of the stresses.