发明名称 Pattern formation method, mask for exposure, and exposure apparatus
摘要 According to one embodiment, a pattern formation method includes preparing a mask pattern for interference, producing Talbot interference, and forming a pattern by blocking a part of interference light. The mask pattern for interference is arranged periodically a plurality of light transmissive portions. The Talbot interference is based on a transmitted light. The transmitted light is transmitted through the light transmissive portions by applying a light to the mask pattern for interference. The part of interference light is produced by the Talbot interference by means of a mask pattern for light blocking and applying another part of the interference light transmitted through the mask pattern for light blocking to an exposure object member.
申请公布号 US9329490(B2) 申请公布日期 2016.05.03
申请号 US201314095533 申请日期 2013.12.03
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 Sato Takashi;Inanami Ryoichi;Ito Shinichi;Tanaka Satoshi
分类号 G03B27/32;G03F7/20 主分类号 G03B27/32
代理机构 Finnegan, Henderson, Farabow, Garrett & Dunner, LLP 代理人 Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
主权项 1. A pattern formation method comprising: preparing a mask pattern for interference, the mask pattern for interference being arranged periodically a plurality of light transmissive portions; producing Talbot interference based on a transmitted light, the transmitted light being transmitted through the light transmissive portions by applying a light to the mask pattern for interference; and forming a pattern by blocking a part of interference light produced by the Talbot interference by means of a mask pattern for light blocking and applying another part of the interference light transmitted through the mask pattern for light blocking to an exposure object member.
地址 Tokyo JP