发明名称 Semiconductor device and manufacturing method thereof
摘要 A semiconductor device includes first and second Fin FET transistors and a separation plug made of an insulating material and disposed between the first and second Fin FET transistors. The first Fin FET transistor includes a first fin structure extending in a first direction, a first gate dielectric formed over the first fin structure and a first gate electrode formed over the first gate dielectric and extending a second direction perpendicular to the first direction. The second Fin FET transistor includes a second fin structure, a second gate dielectric formed over the second fin structure and a second gate electrode formed over the first gate dielectric and extending the second direction. In a cross section along the second direction and across the first gate electrode, the second gate electrode and the separation plug, the separation plug has a tapered shape having a top size smaller than a bottom size.
申请公布号 US9331074(B1) 申请公布日期 2016.05.03
申请号 US201514611159 申请日期 2015.01.30
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 Chang Che-Cheng;Lin Chih-Han
分类号 H01L21/70;H01L27/088;H01L27/092;H01L29/423;H01L29/66;H01L21/8234;H01L21/3105;H01L21/02;H01L21/3213;H01L29/06 主分类号 H01L21/70
代理机构 McDermott Will & Emery LLP 代理人 McDermott Will & Emery LLP
主权项 1. A semiconductor device, comprising: a first Fin FET transistor including a first fin structure extending in a first direction, a first gate dielectric formed over the first fin structure and a first gate electrode formed over the first gate dielectric and extending in a second direction perpendicular to the first direction; a second Fin FET transistor including a second fin structure, a second gate dielectric formed over the second fin structure and a second gate electrode formed over the first gate dielectric and extending in the second direction; and a separation plug made of an insulating material and disposed between the first Fin FET transistor and the second FinFET transistor, wherein in a cross section along the second direction and across the first gate electrode, the second gate electrode and the separation plug, a maximum width of the separation plug is located at a height Hb, which is less than ¾ of a height Ha of the separation plug.
地址 Hsinchu TW