发明名称 Method for producing optical semiconductor device
摘要 A method for producing optical semiconductor devices includes: forming a stacked semiconductor layer on a device substrate to provide an epitaxial substrate having a size corresponding to a section arrangement; forming, on the epitaxial substrate, a mask having a pattern for a semiconductor mesa and for a trench of at least one optical semiconductor device, a width of the trench in the pattern being determined according to a trench width map in which trench width is based upon an in-plane distribution of the thickness of a resin layer of the at least one device, and upon a correlation between the thickness of the resin layer and the trench width; forming a trench structure including the semiconductor mesa and the trench by etching the stacked semiconductor layer using the mask; forming a resin layer on the trench structure; and forming an opening on the semiconductor mesa by etching the resin layer.
申请公布号 US9329451(B2) 申请公布日期 2016.05.03
申请号 US201514605578 申请日期 2015.01.26
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 Kitamura Takamitsu;Yagi Hideki
分类号 H01L21/302;G02F1/225;G06F17/50;H01L21/66;H01L21/311;H01L33/44;G02F1/025;G02B6/136;G02B6/12;G02F1/21 主分类号 H01L21/302
代理机构 Smith, Gambrell & Russell, LLP 代理人 Smith, Gambrell & Russell, LLP
主权项 1. A method for producing a plurality of optical semiconductor devices in a corresponding plurality of sections constituting a section arrangement on a device substrate, at least one of the semiconductor devices having a trench, a semiconductor mesa, and a resin layer, the method comprising the steps of: forming a stacked semiconductor layer on the device substrate to provide an epitaxial substrate having a size corresponding to the section arrangement; forming, on the epitaxial substrate, a mask having a pattern for the semiconductor mesa and for the trench of the at least one optical semiconductor device, a width of the trench in the pattern being determined according to a trench width map in which trench width is based upon an in-plane distribution of the thickness of the resin layer, and upon a correlation between the thickness of the resin layer and the trench width; forming a trench structure including the semiconductor mesa and the trench by etching the stacked semiconductor layer by using the mask; forming a resin layer on the trench structure, the resin layer being formed on an upper surface and a side surface of the semiconductor mesa; and forming an opening on the semiconductor mesa by etching the resin layer, the upper surface of the semiconductor mesa being exposed through the opening.
地址 Osaka JP