发明名称 |
Method for producing optical semiconductor device |
摘要 |
A method for producing optical semiconductor devices includes: forming a stacked semiconductor layer on a device substrate to provide an epitaxial substrate having a size corresponding to a section arrangement; forming, on the epitaxial substrate, a mask having a pattern for a semiconductor mesa and for a trench of at least one optical semiconductor device, a width of the trench in the pattern being determined according to a trench width map in which trench width is based upon an in-plane distribution of the thickness of a resin layer of the at least one device, and upon a correlation between the thickness of the resin layer and the trench width; forming a trench structure including the semiconductor mesa and the trench by etching the stacked semiconductor layer using the mask; forming a resin layer on the trench structure; and forming an opening on the semiconductor mesa by etching the resin layer. |
申请公布号 |
US9329451(B2) |
申请公布日期 |
2016.05.03 |
申请号 |
US201514605578 |
申请日期 |
2015.01.26 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
Kitamura Takamitsu;Yagi Hideki |
分类号 |
H01L21/302;G02F1/225;G06F17/50;H01L21/66;H01L21/311;H01L33/44;G02F1/025;G02B6/136;G02B6/12;G02F1/21 |
主分类号 |
H01L21/302 |
代理机构 |
Smith, Gambrell & Russell, LLP |
代理人 |
Smith, Gambrell & Russell, LLP |
主权项 |
1. A method for producing a plurality of optical semiconductor devices in a corresponding plurality of sections constituting a section arrangement on a device substrate, at least one of the semiconductor devices having a trench, a semiconductor mesa, and a resin layer, the method comprising the steps of:
forming a stacked semiconductor layer on the device substrate to provide an epitaxial substrate having a size corresponding to the section arrangement; forming, on the epitaxial substrate, a mask having a pattern for the semiconductor mesa and for the trench of the at least one optical semiconductor device, a width of the trench in the pattern being determined according to a trench width map in which trench width is based upon an in-plane distribution of the thickness of the resin layer, and upon a correlation between the thickness of the resin layer and the trench width; forming a trench structure including the semiconductor mesa and the trench by etching the stacked semiconductor layer by using the mask; forming a resin layer on the trench structure, the resin layer being formed on an upper surface and a side surface of the semiconductor mesa; and forming an opening on the semiconductor mesa by etching the resin layer, the upper surface of the semiconductor mesa being exposed through the opening. |
地址 |
Osaka JP |