PATENT ANALYSIS METHOD USING A HIERARCHICAL DIAGRAM OF TECHNOLOGY BASED ON STATISTICAL PATENT ANALYSIS

摘要

The present invention relates to a method for analyzing technology by using a patent document, which includes the steps of: extracting words from documents to be analyzed; generating a document-word matrix by using the extracted words; generating a document-keyword matrix by selecting a keyword from the generated document-word matrix; generating a regression model by using the document-keyword matrix; selecting a keyword corresponding to a parameter having significant probability (p-value) equal to or less than a first threshold value among parameters of the generated regression model; and deriving relation between the keywords by using the p-value between the selected keywords. Accordingly, an objective and accurate patent analysis is implemented by deriving technology hierarchy through a statistical analysis and using the derived technology hierarchy.