发明名称 METHODS AND APPARATUS FOR FORMING HORIZONTAL GATE ALL AROUND DEVICE STRUCTURES
摘要 A method of forming a semiconductor device includes: forming a superlattice structure atop the top surface of a substrate, wherein the superlattice structure comprises a plurality of first layers and a corresponding plurality of second layers alternatingly arranged in a plurality of stacked pairs; forming a lateral etch stop layer by epitaxial deposition of a material of the first layer or the second layer of the superlattice structure atop a sidewall of the superlattice structure, or by selectively oxidizing edges of the first layers and second layers of the superlattice structure; subsequently forming a source region adjacent a first end of the superlattice structure and a drain region adjacent a second opposing end of the superlattice structure; and selectively etching the superlattice structure to remove each of the first layers or each of the second layers to form a plurality of voids in the superlattice structure.
申请公布号 WO2016064765(A1) 申请公布日期 2016.04.28
申请号 WO2015US56285 申请日期 2015.10.19
申请人 APPLIED MATERIALS, INC. 发明人 BRAND, ADAM;WOOD, BINGXI SUN;YOSHIDA, NAOMI;DONG, LIN;SUN, SHIYU;NI, CHI-NUNG;KIM, YIHWAN
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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