CRUCIBLE MEASUREMENT DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a method and a measurement device which non-destructively measure a structure of a layer of a silica glass crucible in a thickness direction.SOLUTION: A measurement device which measures a structure of a layer of a silica glass crucible 1 in a thickness direction includes a light emission part 2 which emits laser light to the silica glass crucible 1 serving as a measurement object, and a scattering circumstance measurement part which measures a scattering circumstance indicating a state of scattering of a laser light coming from the light emission part 2 into the silica glass crucible 1. The scattering circumstance measurement part is configured to measure a scattering circumstance at each location in a thickness direction of the silica glass crucible 1.SELECTED DRAWING: Figure 2