SEMICONDUCTOR DEVICES

摘要

A semiconductor device may include a fuse controller and a fuse array. The fuse controller may be configured to generate internal address signals according to a level combination of repair data and may generate first and second voltage control signals in response to a rupture control signal that is enabled to rupture a predetermined fuse set for selecting a failed redundancy word line, in a test mode. The fuse array may include a plurality of fuse sets including the predetermined fuse set. Each of the plurality of fuse sets may be selected according to a level combination of the internal address signals, and the fuse array ruptures the predetermined fuse set for selecting the failed redundancy word line in response to the first and second voltage control signals to output fuse data.

主权项

1. A semiconductor device comprising:
a fuse controller suitable for generating internal address signals according to a level combination of repair data and suitable for generating first and second voltage control signals in response to a rupture control signal enabled to rupture a predetermined fuse set for selecting a failed redundancy word line, in a test mode; and a fuse array including a plurality of fuse sets including the predetermined fuse set, wherein each of the plurality of fuse sets is selected according to a level combination of the internal address signals, and wherein the fuse array ruptures the predetermined fuse set for selecting the failed redundancy word line in response to the first and second voltage control signals to output fuse data.