发明名称 |
METHOD FOR MANUFACTURING ELECTRONIC DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing an electronic device capable of reducing the incidence of defects without lowering the number of electronic devices manufactured per wafer.SOLUTION: A method for manufacturing an electronic device comprises the steps of: processing a surface of a first wafer; bonding a surface of a second wafer to the processed surface of the first wafer; thinning the first wafer by polishing a rear surface of the first wafer on the side opposite to the bonding surface of the second wafer; forming a groove having a prescribed width and a uniform depth along a peripheral part of the rear surface of the thinned first wafer using a dicing blade; attaching a protection layer onto the rear surface of the first wafer on which the groove is formed via an adhesion layer; and polishing the rear surface of the second wafer on the side opposite to the surface to which the protection layer is attached.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016066787(A) |
申请公布日期 |
2016.04.28 |
申请号 |
JP20150178171 |
申请日期 |
2015.09.10 |
申请人 |
TOSHIBA CORP |
发明人 |
TAKU SHINYA;NUMATA HIDEO;OKURA HIROYUKI |
分类号 |
H01L27/14;H01L21/304;H04N5/369 |
主分类号 |
H01L27/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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