发明名称 APPEARANCE INSPECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an appearance inspection system excellent in both inspection based on bright field illumination and dark field illumination, extendability, and a functionality (diversity), and to attain greatly size down and cost down of a whole system.SOLUTION: In a luminaire M1, provided are: a light source unit 3 that has a first light source block B1 arranged at a center and a second light source block B2 arranged around the first light source block B1; an optical processing unit system Uc whose optical axis is consistent with the first light source block B1, and that converts light Co of the light source unit 3 to light Cps having an isotropic irradiation angle, and irradiates the light to an inspection object surface Sd; and an illumination controller Mc that performs lighting control of the light source unit 3. Also, in an imaging device D1, provided is a pupil Dir that transmits light Cps from the first light source block B1, and does not transmit light Cps from the second light source block B2.SELECTED DRAWING: Figure 1
申请公布号 JP2016065772(A) 申请公布日期 2016.04.28
申请号 JP20140194149 申请日期 2014.09.24
申请人 TAKANO CO LTD 发明人 OSHIDA YOSHITADA;AOKI MASAHIRO;TSUBOKA TOMOAKI;YAJIMA MASAO
分类号 G01N21/84 主分类号 G01N21/84
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